Seminar - Advancing Materials Characterization with Scanning Electron Microscopy (SEM)

Abstract:

Scanning electron microscopy (SEM) is a widely used tool to investigate the structure and properties of materials. In this talk, I will provide a concise overview of SEM technology, including analytical modes that enable structural and chemical analysis across length scales from millimeters to nanometers. I will illustrate these concepts using examples from our research group’s activities, work conducted in various UBC laboratories, and relevant studies from the broader literature. To support the objectives of the cluster, I will also outline the range of current SEM-based instruments available at UBC and discuss future plans associated with the $19.1M CFI-IF “Materials for Net-Zero: Enabling the Clean Energy Transition” project, which will significantly enhance our capabilities at the university.

Speaker Bio:

Dr. Ben Britton is a Professor in the Department of Materials Engineering, Faculty of Applied Science at UBC. He heads the “Experimental Micromechanics and Characterization” Group, where his team develops new ways to analyze and understand the mechanical behavior of engineering materials, especially metals and ceramics. Dr. Britton is a leading expert in electron microscopy, known for advancing innovative techniques such as in situ heating, deformation and micro-mechanical testing, and correlative microscopy and microanalysis. He leads and collaborates on multiple research projects at UBC, including the Characterization @ UBC GCRC cluster, and plays a key role in guiding electron microscopy activities at the EMLab within the Department of Materials Engineering.